Laboratory for Molecular Surfaces and Nanotechnology


Precision source measure platform

The Xtralien X100 incorporates two source measure units (source-meters) and two precision voltage meters and is capable of measuring a wide range of research devices including photovoltaics, LEDs and OLEDs, transistors and more.The source measure units output a voltage and then measure both the voltage and current. Each source measure unit has manually selectable ranges so that both large and small currents can be measured with accuracy.


QCM-D

A Q-Sense, E1, Quartz Crystal Microbalance with Dissipation (QCM-D) system is a sensitive interfacial technique to monitor molecules/biomolecules adsorption processes in situ. This instrument is unique due to the capabilities of real time energy dissipation monitoring, frequency and dissipation monitoring of the freely oscillating crystal, fast analysis at 200 data points per second, dynamic range of frequency measurements (5MHz up to 65MHz, 7 total frequencies), and Q-Tools analysis software with the Voigt (viscoelastic), Sauerbrey and kinetic modeling abilities.


SURFACE PLASMON RESONANCE

SPR-Navi is a modular and computer controlled sensing instrument, based on surface plasmon resonance within ~300nm of a sensor surface in real time, label–free monitoring of molecular and bimolecular interactions analysis (binding rate and equilibrium dissociation constants).





LOCALIZED SURFACE PLASMON RESONANCE

The Insplorion Localized Surface Plasmon Resonance (LSPR) spectroscopy is extremely sensitive to changes in the refractive index close to the plasmonic nanoparticles within  50-60 nm. The local refractive index depends on many factors including the solution composition next to the nanoparticles, infinitesimal conformational/orientational changes in adsorbed biomolecules and nanomorphology-determined features.



ATOMIC FORCE MICROSCOPY

Digital Multimode AFM, operated with a Nanoscope IIIa controller is a versatile, high-resolution imaging tool that performs AFM techniques for surface characterization of properties, shapes and sizes. It can perform the full range of scanning probe microscopic techniques including contact mode, tapping mode, phase imaging, lateral force microscopy (LFM), magnetic force microscopy (MFM), electric force microscope (EFM), nanoindenting/scratching. The instrument in the LAMSUN Core Facility is set up for the measurement is air and in liquid, with capabilities of molecule imaging with nanometer scale lateral and atomic scale vertical resolutions under physiological conditions.

CONTACT ANGLE MEASUREMENT

Measurement of contact angle of fluid droplet on surface by digitizing video and accompanying software. The OCA allows the measurement of hydrophobicity/hydrophilicity of surfaces through digital image capture and analysis software. Measurements of surface energy can also be obtained using this instrument.






LANGMUIR BLODGETT MINITROUGH

Langmuir-Blodgett Deposition (LB) Minitrough is a controlled and user programmable instrument for automated Langmuir film experiments. It is used for the fabrication and characterization of single molecule thick films with precise control of thickness, molecular orientation and lateral packing density of molecules. The instrument has a modular design in order to meet a wide variety of applications.





X-RAY DIFFRACTOMETER

X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze thin films, crystals and powders. For thin film materials XRD can be used to determine orientation relationships between substrates and deposited materials. The epitaxial relationship between the substrate and layer material is clearly shown. Critical to this measurement is the in-plane geometry which allows full pole figures to be collected on both the substrate and thin layer.